For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...
Scan insertion to improve test coverage and reduce test pattern volume is very common in today’s DFT tools. All of the major ATPG tool vendors (Synopsys, Cadence, and Mentor) offer this approach in ...
The complicated silicon defect types and defect distribution of new IC manufacturing technologies can result in very low yield for new designs and technology nodes. During technology qualification ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results