The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...

A team of researchers from the Korea Research Institute of Standards and Science (KRISS) has created a hybrid nano-microscope that can measure a variety of nano-material properties simultaneously.

A new method using gold flakes, salt water, and light reveals the tiny forces that bind matter and drive self-assembly, offering fresh insight into nanoscale physics. (Nanowerk News) In the lab at ...