Semiconductor Engineering

Identifying PCB Defects with a Deep Learning Single-Step Detection Model

This new technical paper titled “End-to-end deep learning framework for printed circuit board manufacturing defect classification” is from researchers at École de technologie supérieure (ÉTS) in ...
EurekAlert!

Automated concrete bridge damage detection: a new method using vision transformer-enhanced YOLO

A new method for automated concrete bridge damage detection using an efficient Vision Transformer-enhanced anchor-free YOLO (You Only Look Once) has been proposed by researchers from the University of ...
pv magazine International

Detecting PV module defects at a single glance

Researchers in China have developed a novel deep learning model to detect defects in photovoltaic panels. The approach leverages high-resolution visible light imaging to identify defects using an ...
Semiconductor Engineering

Full-Chip Voltage Contrast Inference Using Deep Learning; You Only Look Once: Voltage Contrast (YOLO-VC)

Abstract: The electron beam inspection methodology for voltage contrast (VC) defects has been widely adopted in the early stages of sub-10nm logic and memory technology development, as well as in new ...