Synopsys Inc. today announced it has upgraded its design-for-test (DFT) and automatic test pattern generation (ATPG) products for system-on-a-chip (SOC) design flow. The upgrades to the company’s ...
It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
A proven method to simplify a complex problem is to break it into smaller chunks. In the case of today’s large, complex SoCs, this means using hierarchical methods to design the blocks, then combine ...
Through generations of technology advances, I’ve seen that as a particular task gets more important and usually more complex, it becomes the target of automation and so becomes greatly simplified.
With any new SoC project, there are more things to go wrong than ever imagined during the optimistic early phase of defining the product, writes Ron Press, of Mentor, a Siemens Business. However, the ...
With regards to the ongoing trend of diminishing transistor geometries, we are witnessing a sharp increase in defect density along with significant on-chip process variations that affect transistor ...
It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
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