Semiconductor Engineering

SRAM-Based IMC For Cryogenic CMOS Using Commercial 5 nm FinFETs

A technical paper titled “Cryogenic In-Memory Computing for Quantum Processors Using Commercial 5-nm FinFETs” was published by researchers at University of Stuttgart, Indian Institute of Technology ...
Semiconductor Engineering

Process Variation Analysis Of Device Performance Using Virtual Fabrication — Methodology Demonstrated On A CMOS 14-nm FinFET Vehicle

A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...
Nature

Low-Power Flip-Flop Design in CMOS Technology

Flip-flops are indispensable memory elements in synchronous digital circuits, latching data on clock transitions and forming the backbone of registers, counters and pipelines. In advanced CMOS ...
Electronic Design

Ring-Oscillator Process Monitors for Wafer-Level CMOS Screening

Ring-oscillator process monitors give production test teams a fast on-die frequency measurement for identifying CMOS process variation and sorting dies at wafer level. A process monitor is a dedicated ...