A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...

The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-Contact TM mode capable of nanoscale surface analysis ...

Thought LeaderDr. George HeathUniversity Academic FellowUniversity of Leeds In this interview, AZoNano speaks with Dr. George Heath from the University of Leeds, UK, about the fundamental principles ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...

For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical properties at the nanoscale—beyond what is visible to the naked eye—are essential.

Doing it yourself may not get you the most precise lab equipment in the world, but it gets you a hands-on appreciation of the techniques that just can’t be beat. Today’s example of this adage: [Stoppi ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Over the last century, humans have experienced multiple severe viral outbreaks, including the Spanish flu and other influenza epidemics, HIV, SARS-CoV, MERS, Ebola, and the recent SARS-CoV2 pandemic.